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Measurement of local critical currents in TFA-MOD processed coated conductors by use of scanning Hall-probe microscopy
K. Shiohara, K. Higashikawa, T. Kawaguchi, M. Inoue, T. Kiss, M. Yoshizumi, T. IzumiVolume:
471
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.physc.2011.05.119
File:
PDF, 1.06 MB
english, 2011