Valley polarized electronic transport through a line defect in graphene: An analytical approach based on tight-binding model
Liwei Jiang, Xiaoling Lv, Yisong ZhengVolume:
376
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.physleta.2011.10.043
File:
PDF, 420 KB
english, 2011