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Fundamental parameter based quantification algorithm for confocal nano-X-ray fluorescence analysis
Tom Schoonjans, Geert Silversmit, Bart Vekemans, Sylvia Schmitz, Manfred Burghammer, Christian Riekel, Frank E. Brenker, Laszlo VinczeVolume:
67
Year:
2012
Language:
english
Pages:
11
DOI:
10.1016/j.sab.2011.12.006
File:
PDF, 1.42 MB
english, 2012