Investigation of sputter-deposited Al–2at.%Cu layers by...

Scripta Materialia 2005 Vol. 53; Iss. 3

Investigation of sputter-deposited Al–2at.%Cu layers by means of the tomographic atom probe (TAP)

Pyuck-Pa Choi, Talaat Al-Kassab, Reiner Kirchheim
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Volume:
53
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.scriptamat.2005.04.008
File:
PDF, 301 KB
english, 2005
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