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Contribution to size effect of yield strength from the stochastics of dislocation source lengths in finite samples
Triplicane A. Parthasarathy, Satish I. Rao, Dennis M. Dimiduk, Michael D. Uchic, Dallas R. TrinkleVolume:
56
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.scriptamat.2006.09.016
File:
PDF, 174 KB
english, 2007