TEM/SEM investigation of microstructural changes within the white etching area under rolling contact fatigue and 3-D crack reconstruction by focused ion beam
A. Grabulov, U. Ziese, H.W. ZandbergenVolume:
57
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.scriptamat.2007.06.024
File:
PDF, 766 KB
english, 2007