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Creep in nanocrystalline Ni during X-ray diffraction
S. Van Petegem, S. Brandstetter, B. Schmitt, H. Van SwygenhovenVolume:
60
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.scriptamat.2008.10.034
File:
PDF, 330 KB
english, 2009