Transmission electron microscopy study of an...

Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride

Jonghan Won, James A. Valdez, Muneyuki Naito, Manabu Ishimaru, Kurt E. Sickafus
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Volume:
60
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.scriptamat.2009.01.023
File:
PDF, 257 KB
english, 2009
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