Nanocrack-induced leakage current in AlInN/AlN/GaN

Nanocrack-induced leakage current in AlInN/AlN/GaN

Albert Minj, Daniela Cavalcoli, Saurabh Pandey, Beatrice Fraboni, Anna Cavallini, Tommaso Brazzini, Fernando Calle
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Volume:
66
Year:
2012
Language:
english
Pages:
4
DOI:
10.1016/j.scriptamat.2011.11.024
File:
PDF, 612 KB
english, 2012
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