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Atom distribution in SnSb2Te4 by resonant X-ray diffraction
Oliver Oeckler, Matthias N. Schneider, Felix Fahrnbauer, Gavin VaughanVolume:
13
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.solidstatesciences.2010.12.043
File:
PDF, 361 KB
english, 2011