Theoretical analysis of effects of deep level, back...

Theoretical analysis of effects of deep level, back contact, and absorber thickness on capacitance–voltage profiling of CdTe thin-film solar cells

Jian V. Li, Adam F. Halverson, Oleg V. Sulima, Shubhra Bansal, James M. Burst, Teresa M. Barnes, Timothy A. Gessert, Dean H. Levi
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Volume:
100
Year:
2012
Language:
english
Pages:
6
DOI:
10.1016/j.solmat.2012.01.003
File:
PDF, 283 KB
english, 2012
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