Thickness dependence of the resistive switching behavior of...

Solid State Communications 2011 Vol. 151; Iss. 23

Thickness dependence of the resistive switching behavior of nonvolatile memory device structures based on undoped ZnO films

Youn Hee Kang, Ji-Hyuk Choi, Tae Il Lee, Woong Lee, Jae-Min Myoung
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
151
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.ssc.2011.08.036
File:
PDF, 573 KB
english, 2011
Conversion to is in progress
Conversion to is failed