Characterization and modeling of capacitances in FD-SOI...

Solid-State Electronics 2012 Vol. 71; Iss. none

Characterization and modeling of capacitances in FD-SOI devices

Imed Ben Akkez, Antoine Cros, Claire Fenouillet-Beranger, P. Perreau, A. Margain, Frederic Boeuf, Francis Balestra, Gérard Ghibaudo
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Volume:
71
Year:
2012
Language:
english
Pages:
5
DOI:
10.1016/j.sse.2011.10.020
File:
PDF, 1.05 MB
english, 2012
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