Distribution of deep-level traps at atomic-layer-deposited...

Solid-State Electronics 2012 Vol. 72; Iss. none

Distribution of deep-level traps at atomic-layer-deposited Al2O3/n-GaN interface

Dawei Yan, Hai Lu, Dunjun Chen, Rong Zhang, Youdou Zheng, Xu Qian, Aidong Li
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Volume:
72
Year:
2012
Language:
english
Pages:
4
DOI:
10.1016/j.sse.2012.02.012
File:
PDF, 370 KB
english, 2012
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