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Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry
C. Bundesmann, N. Ashkenov, M. Schubert, A. Rahm, H.v. Wenckstern, E.M. Kaidashev, M. Lorenz, M. GrundmannVolume:
455-456
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2003.11.226
File:
PDF, 155 KB
english, 2004