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Perovskite oxynitride LaTiOxNy thin films: Dielectric characterization in low and high frequencies
Y. Lu, A. Ziani, C. Le Paven-Thivet, R. Benzerga, L. Le Gendre, D. Fasquelle, H. Kassem, F. Tessier, V. Vigneras, J.-C. Carru, A. SharaihaVolume:
520
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2011.01.226
File:
PDF, 844 KB
english, 2011