Polarized infrared reflectance studies for wurtzite InN...

Polarized infrared reflectance studies for wurtzite InN epilayers on Si(111) grown by molecular beam expitaxy

P.K. Ooi, S.C. Lee, S.S. Ng, Z. Hassan, H. Abu Hassan, W.L. Chen
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Volume:
520
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2011.01.229
File:
PDF, 353 KB
english, 2011
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