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Phase composition of selenized Cu2ZnSnSe4 thin films determined by X-ray diffraction and Raman spectroscopy
M. Ganchev, J. Iljina, L. Kaupmees, T. Raadik, O. Volobujeva, A. Mere, M. Altosaar, J. Raudoja, E. MellikovVolume:
519
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2011.01.388
File:
PDF, 853 KB
english, 2011