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Thickness dependent reactivity and coercivity for ultrathin Co/Si(111) films
C. Chuang, W.Y. Chang, W.H. Chen, J.S. Tsay, W.B. Su, H.W. Chang, Y.D. YaoVolume:
519
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2011.03.089
File:
PDF, 500 KB
english, 2011