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The effects of post-annealing on the performance of ZnO thin film transistors
Seokhwan Bang, Seungjun Lee, Joohyun Park, Soyeon Park, Youngbin Ko, Changhwan Choi, Hojung Chang, Hyungho Park, Hyeongtag JeonVolume:
519
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2011.05.048
File:
PDF, 887 KB
english, 2011