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Reproducible resistance switching of defect-engineered NiOx with metallic Nb impurity
Jonggi Kim, Heedo Na, Sunghoon Lee, Kyumin Lee, Jung-Ho Yoo, Dae-Hong Ko, Hyunchul SohnVolume:
519
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2011.05.074
File:
PDF, 822 KB
english, 2011