![](/img/cover-not-exists.png)
Effect of layer thickness on structural quality of Ge epilayers grown directly on Si(001)
V.A. Shah, A. Dobbie, M. Myronov, D.R. LeadleyVolume:
519
Year:
2011
Language:
english
Pages:
7
DOI:
10.1016/j.tsf.2011.06.022
File:
PDF, 1.46 MB
english, 2011