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Improvement in the bias stability of zinc oxide thin-film transistors using Si3N4 insulator with SiO2 interlayer
Woong-Sun Kim, Yeon-Keon Moon, Kyung-Taek Kim, Sae-Young Shin, Jong-Wan ParkVolume:
520
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2011.07.015
File:
PDF, 716 KB
english, 2011