![](/img/cover-not-exists.png)
In situ thermal residual stress evolution in ultrathin ZnO and Ag films studied by synchrotron x-ray diffraction
P.O. Renault, C. Krauss, E. Le Bourhis, G. Geandier, A. Benedetto, S.Y. Grachev, E. BarthelVolume:
520
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2011.07.060
File:
PDF, 373 KB
english, 2011