Correlation between strain and the metal–insulator transition in epitaxial V2O3 thin films grown by Molecular Beam Epitaxy
L. Dillemans, R.R. Lieten, M. Menghini, T. Smets, J.W. Seo, J.-P. LocquetVolume:
520
Year:
2012
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2011.11.064
File:
PDF, 576 KB
english, 2012