Comparative study of erbium disilicide thin films grown in...

Thin Solid Films 2012 Vol. 520; Iss. 13

Comparative study of erbium disilicide thin films grown in situ under ultrahigh vacuum or ex situ with a capping layer

N. Reckinger, C.A. Duţu, X. Tang, E. Dubois, D.A. Yarekha, S. Godey, L. Nougaret, A. Łaszcz, J. Ratajczak, J.-P. Raskin
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Volume:
520
Year:
2012
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2012.02.076
File:
PDF, 912 KB
english, 2012
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