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Atomic force microscopy and X-ray photoelectron spectroscopy evaluation of adhesion and nanostructure of thin Cr films
A. Lazauskas, V. Grigaliūnas, A. Guobienė, M. Andrulevičius, J. BaltrusaitisVolume:
520
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.tsf.2012.05.065
File:
PDF, 1011 KB
english, 2012