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Transmission electron microscopy at 20 kV for imaging and spectroscopy
U. Kaiser, J. Biskupek, J.C. Meyer, J. Leschner, L. Lechner, H. Rose, M. Stöger-Pollach, A.N. Khlobystov, P. Hartel, H. Müller, M. Haider, S. Eyhusen, G. BennerVolume:
111
Year:
2011
Language:
english
Pages:
8
DOI:
10.1016/j.ultramic.2011.03.012
File:
PDF, 1.02 MB
english, 2011