Imaging and strain analysis of nano-scale SiGe structures...

Ultramicroscopy 2011 Vol. 111; Iss. 11

Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy

Peter Hermann, Michael Hecker, Dmytro Chumakov, Martin Weisheit, Jochen Rinderknecht, Artem Shelaev, Pavel Dorozhkin, Lukas M. Eng
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
111
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.ultramic.2011.08.009
File:
PDF, 926 KB
english, 2011
Conversion to is in progress
Conversion to is failed