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Infrared microspectroscopy combined with conventional atomic force microscopy
B. Kwon, M.V. Schulmerich, L.J. Elgass, R. Kong, S.E. Holton, R. Bhargava, W.P. KingVolume:
116
Year:
2012
Language:
english
Pages:
6
DOI:
10.1016/j.ultramic.2012.03.007
File:
PDF, 1.02 MB
english, 2012