Secondary ion mass spectrometry and X-ray microanalysis of...

Secondary ion mass spectrometry and X-ray microanalysis of hypomineralized enamel in human permanent first molars

Birgitta Jälevik, Hans Odelius, Wolfram Dietz, JörgenG Norén
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Volume:
46
Year:
2001
Language:
english
Pages:
9
DOI:
10.1016/s0003-9969(00)00113-8
File:
PDF, 598 KB
english, 2001
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