Kinetics of Cristobalite Growth on Polycrystalline SiC Film Studied using High-Temperature In Situ X-Ray Diffractometry
T Kingetsu, K Ito, M Takehara, H MasumotoVolume:
33
Year:
1998
Language:
english
Pages:
8
DOI:
10.1016/s0025-5408(98)00043-9
File:
PDF, 130 KB
english, 1998