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Characterization of thin-film amorphous semiconductors using spectroscopic ellipsometry
G.E. Jellison Jr., V.I. Merkulov, A.A. Puretzky, D.B. Geohegan, G. Eres, D.H. Lowndes, J.B. CaughmanVolume:
377-378
Year:
2000
Language:
english
Pages:
6
DOI:
10.1016/s0040-6090(00)01384-5
File:
PDF, 244 KB
english, 2000