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Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices
S. Sadewasser, Th. Glatzel, S. Schuler, S. Nishiwaki, R. Kaigawa, M.Ch. Lux-SteinerVolume:
431-432
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(03)00267-0
File:
PDF, 725 KB
english, 2003