Structural study of thin films by extended energyloss fine...

Structural study of thin films by extended energyloss fine structure spectroscopy

M. De Crescenzi, N. Motta, L. Lozzi, M. Passacantando, P. Picozzi, S. Santucci
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Volume:
193-194
Year:
1990
Language:
english
Pages:
16
DOI:
10.1016/s0040-6090(05)80038-0
File:
PDF, 717 KB
english, 1990
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