Structural analysis of Cu1−xAgxGaSe2 bulk materials and thin films
M.E Beck, T Weiss, D Fischer, S Fiechter, A Jäger-Waldau, M.Ch Lux-SteinerVolume:
361-362
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(99)00785-3
File:
PDF, 215 KB
english, 2000