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Structural, electrical and thermoelectrical properties of (Bi1 − xSbx)2Te3 thin films grown by MOCVD process
B. Aboulfarah, A. Giani, A. Boyer, A. MzerdVolume:
25
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0151-9107(00)80002-1
File:
PDF, 342 KB
english, 2000