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SNOM imaging of very fine pits formed by EB lithography for ultrahigh density optical recording
Sumio Hosaka, Hayato Sone, Yoshitaka Takahashi, Toshimichi Shintani, Keizo Kato, Toshiharu SaikiVolume:
67-68
Year:
2003
Language:
english
Pages:
8
DOI:
10.1016/s0167-9317(03)00133-3
File:
PDF, 794 KB
english, 2003