Native defect properties in β-SiC: Ab initio and empirical...

Native defect properties in β-SiC: Ab initio and empirical potential calculations

Fei Gao, Eric J. Bylaska, William J. Weber, L.René Corrales
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Volume:
180
Year:
2001
Language:
english
Pages:
7
DOI:
10.1016/s0168-583x(01)00430-x
File:
PDF, 94 KB
english, 2001
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