Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
2002 Vol. 190; Iss. 1-4
High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures
T. Osipowicz, H.L. Seng, L.S. Wielunski, E.S. Tok, G. Breton, J. ZhangVolume:
190
Year:
2002
Language:
english
Pages:
6
DOI:
10.1016/s0168-583x(02)00470-6
File:
PDF, 317 KB
english, 2002