Upgrading of the ultra-clean injector for depth profiling...

Upgrading of the ultra-clean injector for depth profiling at the Munich AMS facility

C. Stan-Sion, L. Rohrer, F. Kubo, V. Lazarev, P. Hartung, E. Nolte, R. Behrisch, J. Roth
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Volume:
192
Year:
2002
Language:
english
Pages:
8
DOI:
10.1016/s0168-583x(02)00479-2
File:
PDF, 414 KB
english, 2002
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