Characterization by RBS of hyper-thin SiO2 layers on...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2002 Vol. 192; Iss. 4

Characterization by RBS of hyper-thin SiO2 layers on various polymers

G Dennler, A Houdayer, P Raynaud, Y Ségui, M.R Wertheimer
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Volume:
192
Year:
2002
Language:
english
Pages:
9
DOI:
10.1016/s0168-583x(02)00492-5
File:
PDF, 303 KB
english, 2002
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