Investigation of defects in Fresco substrates by means of...

Investigation of defects in Fresco substrates by means of the ECoSp imaging system and the principal component image analysis

C. Bonifazzi, E. Lodi, G. Maino, V. Muzzioli, L. Nanetti, N. Ludwig, M. Milazzo, A. Tartari
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Volume:
213
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/s0168-583x(03)01689-6
File:
PDF, 427 KB
english, 2004
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