Roughening behavior in Si/SiGe heterostructures under O2+...

Roughening behavior in Si/SiGe heterostructures under O2+ bombardment

G.S. Lau, E.S. Tok, R. Liu, A.T.S. Wee, J. Zhang
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Volume:
215
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/s0168-583x(03)01711-7
File:
PDF, 594 KB
english, 2004
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