Investigation of ion bombarded polymer surfaces using SIMS,...

Investigation of ion bombarded polymer surfaces using SIMS, XPS and AFM

Jong Wan Lee, T.H. Kim, S.H. Kim, C.Y. Kim, Y.H. Yoon, J.S. Lee, J.G. Han
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Volume:
121
Year:
1997
Language:
english
Pages:
6
DOI:
10.1016/s0168-583x(96)00584-8
File:
PDF, 539 KB
english, 1997
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