Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1997 Vol. 130; Iss. 1-4
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Suppression of charge carrier collection in diode with retrograde well and epitaxial layers for soft-error immunity
T. Kishimoto, M. Takai, Y. Ohno, T. Nishimura, M. Inuishi, A. Kinomura, Y. Horino, K. FujiiVolume:
130
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0168-583x(97)00244-9
File:
PDF, 496 KB
english, 1997