Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1998 Vol. 136-138; Iss. none
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Extremely thin silicon ΔE detectors for ion beam analysis
Harry J. Whitlow, Thomas Winzell, Göran ThungströmVolume:
136-138
Year:
1998
Language:
english
Pages:
7
DOI:
10.1016/s0168-583x(97)00875-6
File:
PDF, 630 KB
english, 1998