Extremely thin silicon ΔE detectors for ion beam analysis

Extremely thin silicon ΔE detectors for ion beam analysis

Harry J. Whitlow, Thomas Winzell, Göran Thungström
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Volume:
136-138
Year:
1998
Language:
english
Pages:
7
DOI:
10.1016/s0168-583x(97)00875-6
File:
PDF, 630 KB
english, 1998
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