Defects in SiO2 glass irradiated with high energy Ar ions

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 1998 Vol. 146; Iss. 1-4

Defects in SiO2 glass irradiated with high energy Ar ions

Zhiyong Zhu, Yunfan Jin, Changlin Li, Youmei Sun, Chonghong Zhang, Qinghua Meng
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Volume:
146
Year:
1998
Language:
english
Pages:
7
DOI:
10.1016/s0168-583x(98)00477-7
File:
PDF, 159 KB
english, 1998
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