A new UHV diffractometer for surface structure and real...

A new UHV diffractometer for surface structure and real time molecular beam deposition studies with synchrotron radiations at ESRF

R. Baudoing-Savois, M. De Santis, M.C. Saint-Lager, P. Dolle, O. Geaymond, P. Taunier, P. Jeantet, J.P. Roux, G. Renaud, A. Barbier, O. Robach, O. Ulrich, A. Mougin, G. Bérard
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Volume:
149
Year:
1999
Language:
english
Pages:
15
DOI:
10.1016/s0168-583x(98)00628-4
File:
PDF, 1.02 MB
english, 1999
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