An automated single ion hit at JAERI heavy ion microbeam to...

An automated single ion hit at JAERI heavy ion microbeam to observe individual radiation damage

Tomihiro Kamiya, Takuro Sakai, Yutaka Naitoh, Tsuyoshi Hamano, Toshio Hirao
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Volume:
158
Year:
1999
Language:
english
Pages:
5
DOI:
10.1016/s0168-583x(99)00325-0
File:
PDF, 320 KB
english, 1999
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